NanoTR・PicoTR / Thin Film Thermal Property Measurement Device
The only device capable of measuring the thermal properties of thin films on the nanometer order.
The NanoTR・PicoTR thin film thermal property measurement device is the world's first device capable of measuring the thermal properties of metal films, oxide films, and organic films with high precision. 【Features】 ■ Capable of measuring the thermal diffusivity, thermal conductivity, and interfacial thermal resistance of thin films with thicknesses ranging from several tens of nanometers to several micrometers. ■ Equipped with both RF and FF measurement methods, allowing measurements regardless of the type of substrate. ■ A SI traceable device that complies with JIS R 1689 and JIS R 1690. *For more details, please refer to the catalog or feel free to contact us.
- Company：ネッチ・ジャパン
- Price：Other
